Visit booth 854 at SPIE Photonics West

December 18, 2025 10:30

Visit booth 854 at SPIE Photonics West and see the how
our advanced O-LAMM technology can reduce waste,
downtime, and setup costs in Industry 4.0 applications.

PLX's Orthogonal Laser Metrology Module (O-LAMM) integrates core Monolithic Optical Structure Technology™ (M.O.S.T) and precision Beam Steering Technology, creating a compact and robust 3D laser-scanning system for in situ metrology. 

O-LAMM uses a network of laser units, working together through triangulation, measuring the position of retro-reflective markers, providing robust and accurate 6 degrees of freedom (6-DOF). The compact system maintains arc-second accuracy and operates at 100 Hz scanning speeds.

The use of multiple scanning units avoids line-of-sight issues and can address the most complex metrology challenges, for example, in aerospace manufacturing. 

O-LAMM provides vital, real-time information and can be applied to a wide range of measurement tasks. PLX’s O-LAMM is a compact, scalable device that significantly reduces waste, downtime, and setup costs.

For more information on our high-performance optical technology, products and systems, email us at sales@plxinc.com or visit www.plxinc.com

PLX Inc. 40 W. Jefryn Blvd. Deer Park, NY 11729 Tel. 631.586.4190 • Web. www.plxinc.com

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